Tescan Mira 3 XMU Scanning Electron Microscope – This is a state of the art SEM employing a field emission gun for the utmost in image resolution and magnification. Elemental compositions are determined in the percent range using an Oxford Instruments X-Max EDS (energy dispersive spectrometer) detector. Crystal phase and orientation maps can be determined with an Oxford Instruments Nordlys EBSD (electron back-scatter diffraction) detector. An ATM Saphir Vibro polisher and Cressington sputter coaters (Pt, Pd, C) are available for sample preparation.
Data analysis can be performed on a dedicated workstation which can also be accessed remotely using TeamViewer by prior arrangement.
SEM Booking
Please contact sudip.shrestha@ubc.ca for all SEM related booking requests. Availability can be checked using the SEM booking calendar.
The SEM data processing computer can also be booked in advance. In addition, proficient SEM users can access the computer remotely using TeamViewer. A remote access password will be provided on request.
Data analysis can be performed on a dedicated workstation which can also be accessed remotely using TeamViewer by prior arrangement.
SEM Booking
Please contact sudip.shrestha@ubc.ca for all SEM related booking requests. Availability can be checked using the SEM booking calendar.
The SEM data processing computer can also be booked in advance. In addition, proficient SEM users can access the computer remotely using TeamViewer. A remote access password will be provided on request.
Cameca SXFive Field Emission EPMA for High Resolution Quantitative Analysis and X-Ray Mapping. The SXFiveFE is CAMECA’s fifth generation electron probe microanalyzer offering the unique combination of a field emission electron column with industry-leading high-sensitivity spectrometers. It enables high accuracy quantitative chemical microanalysis and x-ray mapping at the highest possible spatial resolution in mineralogy, geochronology, metallurgy and material sciences.
