Tescan Mira 3 XMU Scanning Electron Microscope – This is a state of the art SEM employing a field emission gun for the utmost in image resolution and magnification. Elemental compositions are determined in the percent range using an Oxford Instruments X-Max EDS (energy dispersive spectrometer) detector. Crystal phase and orientation maps can be determined with an Oxford Instruments Nordlys EBSD (electron back-scatter diffraction) detector. A Struers electro-polisher and a Cressington PtPd sputter coater are available for sample preparation.

SEM Calendar:
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Cameca SXFive Field Emission EPMA for High Resolution Quantitative Analysis and X-Ray Mapping. The SXFiveFE is CAMECA’s fifth generation electron probe microanalyzer offering the unique combination of a field emission electron column with industry-leading high-sensitivity spectrometers. It enables high accuracy quantitative chemical microanalysis and x-ray mapping at the highest possible spatial resolution in mineralogy, geochronology, metallurgy and material sciences.